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Department of Nanometrology

Marcin Palewicz at the University of Nagoya, Japan

Date: 19.09.2025

As part of the ENSIGN international project, Marcin Palewicz, PhD stayed at Nagoya University (Japan) from 12 August to 14 September 2025. During scientific stay at the D-Lab, high speed atomic force microscopy measurements were performed, of organic donor-acceptor layers used in third-generation photovoltaic devices, which allowed to determine the mechanical parameters of the tested objects.

If you are interested, check out what is hidden under the QR codes in the photos.

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