Atomic force microscopy is a diagnostic technique that has been developing intensively for three decades. Advances in modern electronics and computer science open up prospects for implementing new solutions that allow for discovering previously inaccessible secrets of the micro- and nano-world. This area is particularly intensively explored by researchers at the Department of Nanometrology.

The recently implemented solution using direct control of the scanning probe by AI algorithms allows for obtaining positive feedback between the sample and the scanning probe. This results in mutual energy exchange. Since this energy, thanks to the parameters of the scanning tip oscillation selected by artificial intelligence resembling tickling, gradually increases, this results in a rather specific reaction of the sample in certain situations, which, as can be seen in the attached photo, confirms the effectiveness of the developed technique.

- Due to the specific behavior of energy manifested by a constant increase in value, I have provisionally called it Positive Energy. - says Dr. A. Scanner.

- We plan to publish the results of this research this year - adds Professor Processor. - We see that the surface reacts very interestingly to the action of Positive Energy. We want to build a nanopower generator based on this experiment, but we hope that the areas of its practical application will go beyond nanotechnology.