W dniach 26-30 listopada 2025 pracownicy i doktoranci Katedry Nanometrologii prezentowali wyniki swoich badań podczas XIII Workshop on Applications of Scanning Probe Microscopy – STM/AFM 2025. 

AFM-Based Multiprobe Nanorobotic Platforms with Active Piezoresistive Cantilevers
Władysław Kopczyński, Aleksander Pytelewski, Teodor Gotszalk

AFM Investigation of Freshly Collected Maize Leaves Under Near-Natural Conditions
Łukasz Pawlaczyk, Władysław Kopczyński, Dominik Badura, Bartosz Pruchnik, Anna Lehmann-Skoczylas, Teodor Gotszalk

The analysis of the positioning accuracy in the FIB-fabricated sample holders for correlational microscopy applications
Andrzej Sikora, Oliwia Hałuszczak

Spectral analysis of thermoelectric noise using custom FPGA-based DFT acquisition system
Paweł Darasz-Mól, Piotr Smagowski, Tomasz Piasecki, Dominik Badura, Teodor Gotszalk

New probes and calibration structures for scanning probe microscopy
Andrzej Sierakowski, Bartosz Pruchnik, Paweł Janus, Magdalena Kucharska, Piotr Prokaryn, Krzysztof Domański, Krzysztof Skrzypiec, Weronika Sofińska-Chmiel, Dariusz Czułek, Teodor Gotszalk

Microscope with an Active Piezoresistive Cantilever
Dominik Badura, Tomasz Dąbrowa, Bartosz Pruchnik, Władysław Kopczyński, Tomasz Piasecki, Daniel Dusza, Teodor Gotszalk, Ivo Rangelow

Novel Use of an Active Piezoresistive Cantilever to Assess Wear of a Prosthetic Biomaterial with a Custom AFM
Tomasz Dąbrowa, Dominik Badura, Bartosz Pruchnik, Władysław Kopczyński, Teodor Gotszalk, Ivo Rangelow

Integrated AFM-SEM-FIB Platform for Correlative Nanoscale Imaging and Manipulation
Mirosław Woszczyna, Fabian Dietrich, Hans-Georg Pietscher, Javad Basseri, Katherina Ivanova, X.Q. Zhou, Chuan Du, Paweł Budzioch, Janusz Budzioch,Teodor Gotszalk, Ivo W. Rangelow

Luxtorpeda SPM platform for charge transport picometrology
Wojciech Godlewski, Bartosz Pruchnik, Dominik Badura, Teodor Gotszalk