Gratulujemy prof. Jarosławowi Serafińczukowi, Adriannie Piejko oraz innym współautorom opublikowania pracy "High-resolution X-ray diffraction to probe quantum dot asymmetry" wydanej w czasopiśmie Measurement (IF=5,6). Wszystkim życzymy dalszych sukcesów naukowych.

High-resolution X-ray diffraction to probe quantum dot asymmetry

J. Serafińczuk, W. Rudno-Rudziński, M. Gawełczyk, P. Podemski, K. Parzyszek,  A. Piejko, V. Sichkovskyi, J.P. Reithmaier, G. Sęk

The symmetry of nanostructures forming an active part of optoelectronic devices severely impacts their properties. It is crucial for the design of polarization-insensitive semiconductor optical amplifiers or sources of entangled photon pairs. We show how quantum dot symmetry can be measured, including atomic force microscopy and polarization-resolved spectroscopy. We discuss the drawbacks of the typical approaches for nanostructure symmetry detection and propose a way to determine quantum dot geometrical aspect ratio based on high-resolution X-ray diffraction. The offered method provides a non-destructive insight into crystal lattice disturbances reflecting in-plane quantum dot geometrical aspect ratio.

DOI.org/10.1016/j.measurement.2023.113451